Warpage Study of Film-BGA

by Chen, Wen-Bin

Abstract (Summary)
ABSTRACT Wireless communication products require thinner and small packaging to allow for reductions in Cell Phone and PDA product sizes. Currently, the Film-BGA (Ball Grid Array) package is in production for thinner and small case. The Film-BGA package is a thin package that uses polyimide tape as a substrate to reduce the overall package profile to 1 mm and ball pitch is 0.5 mm. The Film substrate can reach 0.11 mm thick or less. Analysis the Film-BGA model consists of a sequentially coupled thermal- mechanical analysis considering epoxy curing, post molding compound and IR-Reflow by MARC. After these processes Film-BGA will occur warpage and residual stress, we will study the sizes of materials on the warpage and residual stress by Taguchi Method. From the MARC analysis, it is found that due to the coefficient of thermal expansion (CTE) mismatch between solder ball, die, molding compound, epoxy and substrate, there exists very high stress near the interfaces of epoxy and results the maximum warpage (y-displacement) that occurs at the edge of the substrate after IR-Reflow. By means of the Taguchi Method, it is found that die size greatly affect the warpage of Film-BGA more than epoxy size and molding compound size. It is also found that epoxy size has more effect than die size and molding compound size on the residual stress of Film-BGA.
Bibliographical Information:

Advisor:Shi-Pin Ho; Chorng-Fuh Liu; Shyue-Jian Wu; Wen-Tung Chien

School:National Sun Yat-Sen University

School Location:China - Taiwan

Source Type:Master's Thesis

Keywords:ball grid array residual stress film substrate warpage


Date of Publication:06/21/2001

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