Details

Test generation for realistic defects

by Krishnamachary, Arun.

Abstract (Summary)
Supervisor: Jacob. A. Abraham. Vita. Includes bibliographical references. Available also from UMI Company.
Bibliographical Information:

Advisor:

School:The University of Texas at Austin

School Location:USA - Texas

Source Type:Master's Thesis

Keywords:microprocessors

ISBN:

Date of Publication:

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