A Non-Contact Measurement Technique At The Micro Scale
Abstract (Summary)
During their production and normal use, electronic packages experience large
temperature excursions, leading to high thermo-mechanical stress gradients that cause
fatigue failure of the solder joints. In order to prevent premature failure and prolong the
fatigue life of solder joints, there is a pressing need for the characterization of the solder,
especially lead-free solder, at the micro-level (joint size). The characterization and
modeling of solder behavior at the appropriate scale is a major issue. However, direct
measurement techniques are not applicable to characterize the deformation response of
solder joints because of their micro scale dimensions. Therefore, a non-contact
measurement technique utilizing a Scanning Electron Microscope (SEM) in conjunction
with Digital Image Correlation (DIC) has been developed. Validation was achieved by
performing a four-point bending test in both an in-house optical system with DIC and
inside the SEM. This non-contact measurement technique was then used to extract the
stress-strain response of the solder. Mechanical tests were performed on solder joints that
were created using the same type of solder balls used in the electronic industry and were
representative of normal joint scales. The SEM-DIC technique has been proven to be
applicable for the determining the stress-strain response of solder material at the microscale.
This study resulted in a validated material characterization technique specifically
designed for micro-scale material response. One of the main contributions of this study is
that the method is a lot simpler and cheaper, yet highly effective, compared to the
previous methods. This technique is also readily applicable to the measurement of the
13
stress-strain response of any micro-scale specimen, such as other metals, polymers, etc.
Also, the measured displacement field by obtained by DIC can be used as the base for
calculating the strain field on the surface of a specimen.
14
Bibliographical Information:
Advisor:
School:The University of Arizona
School Location:USA - Arizona
Source Type:Master's Thesis
Keywords:
ISBN:
Date of Publication: