Mechanical Support Design of Analyzer for a Diffraction Enhanced X-Ray Imaging (DEI) System

by Alagarsamy, Nagarajan

Abstract (Summary)
Diffraction Enhanced X-ray Imaging (DEI) uses synchrotron X-ray beams prepared and analyzed by perfect single crystals to achieve imaging contrast from a number of phenomena taking place in an object under investigation. The crystals used in DEI for imaging requires high precision positioning due to a narrow rocking curve. Typically, the angular precision required should be on the order of tens of nanoradians.

One of the problems associated with DEI is the inability to control, set, and fix the angle of the analyzer crystal in relation to the beam exiting the monochromator in the system. This angle is used to interpret the images acquired with an object present and the usual approach is to determine where the image was taken after the fact. If the angle is not correct, then the image is wasted and has to be retaken. If time or dose is not an issue, then retaking the image is not a serious problem. However, since the technique is to be developed for live animal or eventually human imaging, the lost images are no longer acceptable from either X-ray exposure or time perspectives.

Therefore, a mechanical positioning system for the DEI system should be developed that allows a precise setting and measurement of the analyzer crystal angles. In this thesis, the fundamental principles of the DEI method, the DEI system at the National Synchrotron Light Source (NSLS) and the sensitivity of the DEI system to vibration and temperature has been briefly studied to gain a better understanding of the problem. The DEI design at the NSLS was analyzed using finite element analysis software (ANSYS) to determine the defects in the current design which were making the system dimensionally unstable. Using the results of this analysis, the new analyzer support was designed aiming to eliminate the problems with the current design. The new design is much stiffer with the natural frequency spectrum raised about eight times.

This new design will improve the performance of the system at the National Synchrotron Light Source (NSLS) of Brookhaven National Laboratory, New York, USA and should assist in the development of a new DEI system for the Bio-Medical Imaging and Therapy (BMIT) beamline at the Canadian Light Source (CLS), Saskatoon, CANADA.

Bibliographical Information:

Advisor:Zhang, W. J. (Chris); Sumner, David; Szyszkowski, Walerian; Fotouhi, Reza; Chapman, Leroy

School:University of Saskatchewan

School Location:Canada - Saskatchewan

Source Type:Master's Thesis

Keywords:diffraction enhanced x ray imaging dei analyzer mechanical support design finite element analysis fea modal


Date of Publication:05/18/2007

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