?IDDQ Testing of a CMOS 12-Bit Charge Scaling Digital-to-Analog Converter
This work presents design, implementation and test of a built-in current sensor (BICS) for ?IDDQ testing of a CMOS 12-bit charge scaling digital-to-analog converter (DAC). The sensor uses power discharge method for the fault detection. The sensor operates in two modes, the test mode and the normal mode. In the test mode, the BICS is connected to the circuit under test (CUT) which is DAC and detects abnormal currents caused by manufacturing defects. In the normal mode, BICS is isolated from the CUT. The BICS is integrated with the DAC and is implemented in a 0.5 ?m n-well CMOS technology. The DAC uses charge scaling method for the design and a low voltage (0 to 2.5 V) folded cascode op-amp. The built-in current sensor (BICS) has a resolution of 0.5 ?A. Faults have been introduced into DAC using fault injection transistors (FITs). The method of ?IDDQ testing has been verified both from simulation and experimental measurements.
Advisor:Jin-Woo Choi; Suresh Rai; Ashok Srivastava
School:Louisiana State University in Shreveport
School Location:USA - Louisiana
Source Type:Master's Thesis
Keywords:electrical computer engineering
Date of Publication:06/29/2006