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From nanoscale to macroscale using the atomic force microscope to quantify the role of few-asperity contacts in adhesion

by Thoreson, Erik J.

Abstract (Summary)
Keywords: Surface roughness; Surface forces; Van der Waals forces. Includes bibliographical references.
Bibliographical Information:

Advisor:

School:Worcester Polytechnic Institute

School Location:USA - Massachusetts

Source Type:Master's Thesis

Keywords:adhesion surface roughnes microelectromechanical systems

ISBN:

Date of Publication:

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