From nanoscale to macroscale using the atomic force microscope to quantify the role of few-asperity contacts in adhesion
Abstract (Summary)
Keywords: Surface roughness; Surface forces; Van der Waals forces. Includes bibliographical references.
Bibliographical Information:
Advisor:
School:Worcester Polytechnic Institute
School Location:USA - Massachusetts
Source Type:Master's Thesis
Keywords:adhesion surface roughnes microelectromechanical systems
ISBN:
Date of Publication: