Digital DLTS studies on radiation induced defects in Si, GaAs and GaN
Abstract (Summary)
Includes summary. Includes bibliographical references. Available on the Internet via the World Wide Web.
Bibliographical Information:
Advisor:
School:University of Pretoria/Universiteit van Pretoria
School Location:South Africa
Source Type:Master's Thesis
Keywords:deep level transient spectroscopy semiconductors signal processing computers
ISBN:
Date of Publication: