Defect site prediction based upon statistical analysis of fault signatures

by Trinka, Michael Robert

Abstract (Summary)
Good failure analysis is the ability to determine the site of a circuit defect quickly and accurately. We propose a method for defect site prediction that is based on a site's probability of excitation, making no assumptions about the type of defect being analyzed. We do this by analyzing fault signatures and comparing them to the defect signature. We use this information to construct an ordered list of sites that are likely to be the site of the defect.
Bibliographical Information:

Advisor:Mercer, M. Ray; Reddy, A. L. Narasimha; Childs, S. Bart

School:Texas A&M University

School Location:USA - Texas

Source Type:Master's Thesis

Keywords:defect testing circuit fault diagnosis


Date of Publication:08/01/2003

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