Data Dependence Analysis and Its Applicatons on Loop Transformation

by Yang, Cheng-Ming

Abstract (Summary)
For the past several decades, parallel processing has become an important research subject in the computer science area. According to the statistics, in executing a numerical program, most of time is spent on the loops. If we can use the technique of loop restructuring in the parallelizing compiler such that the conventional sequential program can be executed by exploiting the characteristics of vector machine or parallel machine, the execution efficiency will be greatly improved. In the parallelizing compiler, data dependence analysis is very important because it provides the information for loop restructuring. Data dependence analysis is necessary in order to determine whether a loop can be vectorized or parallelized. It analyzes whether the same array element or variable will be accessed more than once in a loop (e.g. access the same memory location more than once in loop execution). In the recent years, the researches on parallelizing compiler are considerable. But, data dependence analysis is still a bottleneck. There are many data dependence test such as Banerjee Test, test, Omega Test, I Test, Power Test, ... and so on, which have been used in the design of parallelizing compiler. In the thesis, we will propose a novel exact data dependence test method called Interval Reduced test (IR test). This method reduces the integer boundary of each constraint variable by repeatedly projection. When the effective region of a variable is reduced to be empty, the constraint containing this variable has no integer solution and the memory accesses under this constraint are therefore independent. The IR test is only suitable for the loops in which the loop bounds are rectangular, triangular, or unknown at compiling-time in some limited condition. To enhance the data dependence analysis capability of the IR test, we proposed the Extension-IR test in this thesis to extend the dependence testing range of one-dimensional array references to linear subscripts with variable bounds under any given direction vector. The Extension-IR test can solve in effective polynomial time. When array subscripts are non-linear expressions or too complex to analyze by the existing data dependence testing schemes, we devise a new parallelization algorithm called non-linear array subscripts test (NLA test) to deal with. The iterations subject to loop-carried dependence are scheduled into different wavefronts, while the iterations with no loop-carried dependence are assigned into the same wavefront. Based on the wavefront information, the original loop is transformed into parallel code for execution at run-time. Loop interchange is an important restructuring technique for supporting vectorization and parallelization. In this thesis, we proposed a technique, which can determine efficiently, whether loops can be interchanged between two non-adjacent loops on perfect nested loop or some imperfectly nested loop. A method for determining whether two arbitrary levels in perfectly nested loops, which contain IF and GOTO statements, can be interchanged is also presented in this thesis.
Bibliographical Information:

Advisor:Sheng-De Wang; Pei-Zong Lee; Jhing-Fa Wang; Tsung-Chuan Huang; Jang-Ping Sheu; Shian-Shyong Tseng; Chu-Sing Yang; Chih-Ping Chu

School:National Sun Yat-Sen University

School Location:China - Taiwan

Source Type:Master's Thesis

Keywords:data dependence analysis parallel compiler


Date of Publication:07/18/2000

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