Coated Conductors and Chemical Solution Growth of YBCO Films: A Micro-Raman Spectroscopy Study
We present the non-destructive studies on coated conductors and YBCO TFA-MOD films by micro-Raman spectroscopy complemented by other techniques such as XRD, SEM, TEM, resistiviy and critical current density. We determined quantitatively the degree of uniaxial and biaxial texture of YBCO coated conductors and investigated aspects like crystal orientation, uniformity, secondary phases, impurities, oxygen content and defects of TFA-MOD grown films based on the specific Raman selection rules for YBCO and polarized Raman scattering experiments. Moreover, we have studied the main YBCO TFA growth parameters and their relevance in the final microstructure and superconducting properties. Finally, we studied the role of the intermediate phases on the mechanism of YBCO nucleation and growth.
Advisor:Mestres, Narcís; Puig, Teresa
School:Universitat Autónoma de Barcelona
Source Type:Master's Thesis
Keywords:404 departament de fisica
Date of Publication:02/24/2005