40 Gbps SiGe pattern generator IC with variable clock skew and output levels
Abstract (Summary)
by Matthew John Zahller, MS
Washington State University
December 2006
Chair: George S. La Rue
A single-chip 40 Gbps pattern generator design in 0.18 µm SiGe BiCMOS
technology is described. An on-chip 128x128 bit RAM with an access time of 3 ns stores
the data pattern. A hybrid 128:1 CMOS/ECL multiplexer increases the output data rate
from the RAM to 40 Gbps. The output driver is back terminated with 50 ohms and
provides programmable levels in the range -2 V to 2 V into a 50 ohm load. The simulated
pattern dependent jitter is under 1 ps at all output levels. The clock can be delayed by a
programmable number of clock cycles plus a vernier delay of up to 50 ps in 0.2 ps steps
in simulation. Power dissipation is up to 1.5 W depending on the output amplitude and
termination voltage.
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Bibliographical Information:
Advisor:
School:Washington State University
School Location:USA - Washington
Source Type:Master's Thesis
Keywords:integrated circuits
ISBN:
Date of Publication: